[audiobook] Bridges (Our Earth Collection) by Victoria Charles in Arts-Photography

Description

Computed Electron Micrographs and Defect Identification illustrates a technique for identifying defects in crystalline solids by the comparison of their images; which are produced in the electron microscope; with corresponding theoretical images. This book discusses the diffraction of electrons by a crystal; the two-beam dynamical equations; the absorption parameters; the deviation of the crystal from the Bragg reflecting position; the extinction distance; the displacement vector; and the foil normal. Chapter three presents the experimental techniques for determination of beam direction; defect line normal; foil normal; foil thickness; and extinction distance. Chapters four to seven explore ONEDIS and TWODIS and their principles. Chapters eight and nine focus on the application and limitations of the technique; while the last chapter explores the different computer programs related to the technique. Post-graduate students; as well as researchers using transmission electron microscopy for studying defects in crystalline solids; will find this book invaluable.