In the Midwest; wetlands can be seen as a nuisance to farmers as they can severely increase production costs. Wetlands are however are a major part of ecology for migratory waterfowl and drainage of these wetlands could have dire consequences on the population of waterfowl as well as other wildlife. Originally published in 1971; this report attempts to break down the economic factors of competition for wetlands in Minnesota and surrounding areas in a policy-relevant way and to suggest new policy alternatives. This title will be of interest to students of Environmental Studies.
#3722731 in eBooks 2012-12-02 2012-12-02File Name: B01D88X2KK
Review
0 of 0 people found the following review helpful. Classic text on two beam diffraction contrast simulation of extended defects in tranmission electron microscopyBy UlfilasOver twenty five years ago one of my mentors introduced me to this book and its methods. Head and coauthors give a straight forward explanation of two beam diffraction contrast of extended defects such as dislocations and stacking faults in transmission electron microscopy. This books detailed discussion of the Howie-Whelan equations and the geometry of the calculation is nearly unique and not found in any other textbook. It should also be mentioned that Head et al. use boundary conditions to reduce a two dimensional calculation to one dimension. thereby greatly increasing computational efficiency. The book contains a complete set of FORTRAN programs which are listed line by line in the text. as this book was published in 1973--way before web sites with such programs existed. It should be added that a modern text with much of the material in Head et al. is Marc De Graefs book Introduction to Conventional Transmission Electron Microscopy (Cambridge Solid State Science Series). Head et al. is still worth a good read. however. even after studying De Graefs text. Ultimately. the usefulness of this approach is due to the limitations inherent in qualitative nature of the "g dot b" type of TEM analysis. as to what constitutes high. low. or negligible contrast of defects for various diffraction conditions. Simulations such as those pioneered by Head et al. provide the electron microscopist with a much clearer guide to interpreting contrast in conventional TEM images.
