This well-illustrated think piece provides a much needed and topical philosophical introduction to the place of environmental design in architecture.The Environments of Architecture sets out a range of considerations necessary to produce appropriate internal environments in the context of a wider discussion on the effect of building decisions on the broader environment. The authors; from architecture and engineering; academia and practice; provide a rounded and well-balanced introduction to this important topic. Starting from a belief that the built environment can contribute more positively to the planet and the pleasure of places as well as answering the practical demands of comfort; they cover site planning; form; materials; construction and operation as well as looking at design on a city level.Presenting a thoughtful and stimulating approach to the built environment; this book forms an excellent guide for practitioners; students and academics concerned with our built environment.
#795823 in eBooks 2014-09-09 2014-09-09File Name: B00J1IOBLG
Review
0 of 0 people found the following review helpful. Classic text on two beam diffraction contrast simulation of extended defects in tranmission electron microscopyBy UlfilasOver twenty five years ago one of my mentors introduced me to this book and its methods. Head and coauthors give a straight forward explanation of two beam diffraction contrast of extended defects such as dislocations and stacking faults in transmission electron microscopy. This books detailed discussion of the Howie-Whelan equations and the geometry of the calculation is nearly unique and not found in any other textbook. It should also be mentioned that Head et al. use boundary conditions to reduce a two dimensional calculation to one dimension; thereby greatly increasing computational efficiency. The book contains a complete set of FORTRAN programs which are listed line by line in the text; as this book was published in 1973--way before web sites with such programs existed. It should be added that a modern text with much of the material in Head et al. is Marc De Graefs book Introduction to Conventional Transmission Electron Microscopy (Cambridge Solid State Science Series). Head et al. is still worth a good read; however; even after studying De Graefs text. Ultimately; the usefulness of this approach is due to the limitations inherent in qualitative nature of the "g dot b" type of TEM analysis; as to what constitutes high; low; or negligible contrast of defects for various diffraction conditions. Simulations such as those pioneered by Head et al. provide the electron microscopist with a much clearer guide to interpreting contrast in conventional TEM images.
